The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2002

Filed:

Apr. 20, 1999
Applicant:
Inventors:

Teruaki Kanzaki, Tokyo, JP;

Sakae Itoh, Tokyo, JP;

Tatsuya Sakai, Kanagawa, JP;

Hiroshi Uchiike, Kanagawa, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A debug circuit ( ) and a microcomputer incorporating the debug circuit ( ). The debug circuit ( ) is capable of receiving a trace event from a functional block A as long as a CPU ( ) does not generate any trace event, and capable of receiving the trace event from the functional block A in synchronization with a standard clock signal CLK used in the CPU ( ) when the reception of the trace event from the functional block A is permitted.


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