The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Dec. 08, 1999
Daniel W. Bailey, Northboro, MA (US);
Jeffrey D. Pickholtz, Marlboro, MA (US);
Shane L. Bell, Shrewsbury, MA (US);
Richard B. Watson, Jr., Harvard, MA (US);
William J. Bowhill, Framingham, MA (US);
Compaq Information Technologies Group LP, Houston, TX (US);
Abstract
A clock distribution system for a semiconductor device provides for both on-chip and in-package clock distribution via on-chip and in-package clock distribution networks. Each of these networks is selectively enabled depending on the mode of operation. Specifically, for wafer testing, the on-chip clock distribution network is selected. Thus, a probe tester need only provide a single clock source with conventional timing specifications to test the operation of the chip. In contrast, during normal operation, an in-package clock distribution network is enabled. In-package clock routing provides the lowest variation mode and thus, will result in the maximum clock frequency for the chip.