The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2002

Filed:

May. 12, 1999
Applicant:
Inventors:

Michael Reese Jones, Longmont, CO (US);

Juan Li, San Jose, CA (US);

Dung Kim Nguyen, San Jose, CA (US);

Hai-Fang Yun, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/214 ;
U.S. Cl.
CPC ...
G06F 1/214 ;
Abstract

Aspects for increasing concurrency during staging and destaging of a log structured array (LSA) are described. In an exemplary method aspect, the method includes determining a process type making a request for access to a locking mechanism associated with an LSA directory entry for a logical track, and determining a lock status for the locking mechanism. Access to the locking mechanism is then provided according to the determined process type and lock status. Further, a destaging process is allowed to obtain an available locking mechanism in a read-write mode, a staging process is allowed to obtain an available locking mechanism in a read-only mode, and a garbage collection process is allowed to obtain an available locking mechanism initially in a read-only mode and subsequently in a read-write mode, wherein increased concurrency results during the staging and destaging processes.


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