The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Mar. 06, 2000
Ralph W. Bennett, Tallahassee, FL (US);
Robert W. Mayer, Tallahassee, FL (US);
Harold F. Qualls, Tallahassee, FL (US);
Steven F. Bellenot, Tallahassee, FL (US);
Other;
Abstract
A method for creating a full surface model of a log using optical scanners mounted on an existing infeed assembly. The method recognizes that a log is only stable for a portion of its travel along the infeed assembly, meaning that only portions of the log may be accurately scanned for both cross-sectional and positional data. The balance of the log can only be scanned for cross-sectional data. The method uses the regions of the log for which both cross-sectional and positional data are known to create a theoretical centerline for the entire log. The cross-sections for the regions without positional data are then placed along the theoretical centerline and all the cross sections are blended together to create a full surface model. The full surface model is then used to determine the optimum configuration of dimensioned lumber which may be sawn from the log.