The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2002

Filed:

Jul. 26, 1999
Applicant:
Inventors:

Yoshihiro Ino, Kawanishi, JP;

Toshiyoshi Yamamoto, Sanda, JP;

Koichi Ohmori, Toyonaka, JP;

Yasuhiko Shinkaji, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

An X-ray imaging apparatus of the present invention is configured so that image data outputting means receives X-rays and outputs image data containing plural pixels, and, when a pixel value of a designated pixel in the image data is larger than a maximum pixel value of pixels surrounding the designated pixel by a predetermined value or more, abnormal data eliminating means judges the designated value as an abnormal data and corrects the abnormal data, thereby an optimum image quality adjustment is automatically conducted in accordance with an exposure object.


Find Patent Forward Citations

Ino, Yoshihiro. (2002). X-ray imaging apparatus and recording medium therefor (U.S. Patent No. 6463169). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6463169

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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