The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Nov. 16, 1999
Applicant:
Inventor:
Stephen O'Brien, Lower Macungie Township, Lehigh County, PA (US);
Assignee:
Agere Systems Guardian Corp., Orlando, FL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/700 ;
U.S. Cl.
CPC ...
G02B 2/700 ;
Abstract
A multi-wavelength etalon comprises at least two regions with different indices of refraction. The change in refractive index alters the wavelengths of incident light, and thus the number of wavelengths between the reflective surfaces of the etalon, and therefore the etalon's transmission characteristics. By selecting specific indices of refraction, an etalon can be provided which produces peaks and troughs at preselected wavelengths in each region. The transition between two adjacent regions with different indices of refraction can be graded to reduce optical interference which may result from an abrupt transition.