The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Apr. 13, 2001
David M. Braun, Santa Rosa, CA (US);
Benjamin S. Wheeler, Santa Rosa, CA (US);
Rance M. Fortenberry, Santa Rosa, CA (US);
Gregory S. Hill, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A wavelength meter for measuring the wavelength of an input light signal. The meter includes a beam splitter, a fixed mirror, and a moveable mirror, the beam splitter splits the input signal into a first input signal and a second input signal, the first and second input signals being reflected from the fixed and moveable mirrors, respectively, and being recombined by the beam splitter. The first reference light signal is reflected by the fixed mirror and the second reference light signal is reflected by the moving mirror, the beam splitter recombines the first and second reference light signals to form a combined reference light signal. The amplitude of the combined reference light signal is detected by a reference detector that generates a reference signal related to the amplitude of the combined reference light signal. The wavelength meter also includes a position circuit for generating a start signal indicating that the moveable mirror is at a first position relative to the fixed mirror and that the moveable mirror is moving in a first direction. A controller records a sequence of measurement signal values in response to the start signal and the reference signal.