The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2002

Filed:

Oct. 08, 1999
Applicant:
Inventors:

Hiroki Yoshikawa, Hiratsuka, JP;

Tetsu Ohishi, Hiratsuka, JP;

Hideo Tanide, Fujisawa, JP;

Takesuke Maruyama, Yokohama, JP;

Goro Ohnishi, Machida, JP;

Takashi Iwata, Hadano, JP;

Takeshi Igarashi, Ayase, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 ;
U.S. Cl.
CPC ...
G02F 1/1335 ;
Abstract

An enlarging unit comprises a concave Fresnel lens warped convexly toward an image forming unit side, the image forming unit is held between a light transmissible support plate warped convexly toward the image forming unit side and the enlarging unit warped convexly toward the image forming unit side, and peripheries of the support plate and the enlarging unit are fixed or semi-fixed. Thereby, deformation caused when the incident side and emission side micro-lens arrays are molded and deformation due to environmental temperature and humidity change are corrected, and both components are always maintained in close contact.


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