The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Oct. 19, 2000
Applicant:
Inventor:
Yukio Inokuti, Chiba, JP;
Assignee:
Kawasaki Steel Corporation, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/7295 ; G01N 2/320 ;
U.S. Cl.
CPC ...
H01J 3/7295 ; G01N 2/320 ;
Abstract
A compact device for measuring crystal orientation and crystal distortion in polycrystalline materials is disclosed. The device includes a focused electron beam generator unit, a sample holder, an electron beam detector, a Kossel X-rays detector, an image processor, and a display. The device employs the Kossel X-rays reflection method to measure crystal distortion and to measure crystal orientation in the inner portion of polycrystalline materials, slightly deeper than the shallow surface, while employing the electron beam diffraction method to measure crystal orientation at the shallow surface.