The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2002

Filed:

Jul. 28, 2000
Applicant:
Inventors:

Mark Leroy Walker, Layton, UT (US);

Dale O. Butterfield, Spokane, WA (US);

Charles W. Gunnell, Spokane, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D04H 1/00 ;
U.S. Cl.
CPC ...
D04H 1/00 ;
Abstract

Disclosed is an apparatus and a method for the manufacture of continuous micro label strips containing a unique identifier, and the placement of the micro label strips into various articles such as cloth and clothing. Microfilm bearing a plurality of transverse or longitudinal rows, each row including one or more unique like identifiers, is longitudinally severed into continuous micro label strips. The strips, or portions thereof, are then woven, sewn or knitted into or onto cloth or clothing.


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Walker, Mark. (2002). Continuous micro-label apparatus and process (U.S. Patent No. 6461987). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6461987

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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