The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Aug. 24, 2001
Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);
Bret Ja Chisholm, Clifton Park, NY (US);
Daniel Robert Olson, Voorheesville, NY (US);
James Norman Cawse, Pittsfield, MA (US);
Michael Matthew Laurin, Pittsfield, MA (US);
George Frederic Medford, Ballston Lake, NY (US);
Hariklia Dris Reitz, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
This invention relates to methods for testing elongation and cracking of coating arrays. The method includes simultaneously applying an elongating force to each of a plurality of coatings, and monitoring the coating integrity including cracks and thickness decrease in each coating. A relative performance characteristic of each coating is then determined based on a correlation between a detected crack and/or thickness decrease in the coating, and the corresponding elongating force.