The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2002

Filed:

Dec. 15, 1999
Applicant:
Inventors:

Kunihiro Hoshino, Tokyo, JP;

Yoshihiko Takano, Tokyo, JP;

Takeshi Miyabayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/008 ; G01N 1/00 ; G01N 1/28 ;
U.S. Cl.
CPC ...
G01N 3/008 ; G01N 1/00 ; G01N 1/28 ;
Abstract

The invention relates to a method of trace analysis of organic compounds which calls for the steps of setting a test piece in a flow cell, and thereafter removing organic compounds from the test piece by heating it at high temperature in an oven. The compounds are concentrated in a trap tube and then removed from the trap tube and carried into a concentrating/inlet unit, such as a thermal desorption cold trap injector. In this unit, cryofocusing of the compounds is performed, and then the organic compounds are introduced into a gas chromatograph to be analyzed therein, wherein a part of the purified inert gas is caused, except during the process of trapping the organic compounds, to flow into the flow cell from the direction opposite the direction from which the gas flows along the trapping line. The invention also provides an apparatus to be used for the method, including an analyzer having a flow cell, a trap tube connected to the flow cell, a detector connected to the trap tube, and a flow rate controller connected to the flow cell. This can be brought into communication with the trap tube and is so formed as to permit a test piece, such as a wafer, to be removably set therein and also permit a carrier gas to flow therethrough. A channel for purified inert gas is provided between the flow rate controller and the flow cell and also between the flow rate controller and a valve that communicates with the flow cell.


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