The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2002
Filed:
Jan. 16, 2001
Dale R. Greer, Novi, MI (US);
Gregory A. Dale, Novi, MI (US);
Perceptron, Inc., Plymouth, MI (US);
Abstract
A calibration system is provided for calibrating a sensor with respect to an external reference frame associated with manufacturing gauging station. A target calibration device is positioned at a vantage point to detect and calibrate its reference frame in relation to the external reference frame. A reference target having at least three non-coplanar reflective surfaces is illuminated by the structured light emanating from the sensor. In this way, the calibration system is able to determine the spatial location and orientation of the reference target in relation to the sensor. The calibration system further includes a coordinate transformation system for coordinating the measurement data from the target calibration device and from the feature sensor, whereby the feature sensor is calibrated with respect to the external reference frame.