The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2002

Filed:

Aug. 25, 1998
Applicant:
Inventor:

Karen B. Sarachik, Newton, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/36 ;
Abstract

A method is provided for measuring distances between locations in an image. The method includes finding a position of a full model using sub-models to find a plurality of locations in an image, then labeling the locations and determining distances using the labels. The method improves upon conventional gauging techniques by exploiting information typically provided by a sub-model based shape finder so as to eliminate one or more computationally intensive applications of one or more vision tools. More specifically, the features of the found instance of the model that are used as a basis for performing measurements are those features that have already been accurately located by the sub-model based shape finder.


Find Patent Forward Citations

Sarachik, Karen. (2002). Gauging using sub-model poses (U.S. Patent No. 6459820). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6459820

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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