The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2002

Filed:

Jun. 01, 2000
Applicant:
Inventors:

Jacobus van Geel, Ettlingen-Oberweier, DE;

André Lagerwaard, Capelle aan den Ijssel, NL;

Assignee:

European Community (EC), Luxembourg, LU;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21G 1/06 ; G01T 5/02 ;
U.S. Cl.
CPC ...
G21G 1/06 ; G01T 5/02 ;
Abstract

A method is provided for the quantitative determination of fissile material content in small size particles present in samples. The samples are sandwiched in organic sheets and then submitted to a defined thermal neutron fluence whereupon fission products of the fissile material in the sample create in the sheets fission tracks which are rendered visible by etching the sheets. Then the size of selected particles having created such tracks is. determined by means of a microscope and thereafter these visible tracks of the selected particles are compared to pre-established standard tracks obtained by the same process from particles of different stepped known size and enrichment ratio.


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van Geel, Jacobus. (2002). Method for the quantitative determination of the fissile material content in small size particles (U.S. Patent No. 6459747). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6459747

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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