The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2002

Filed:

Feb. 18, 2000
Applicant:
Inventors:

Koshu Kurokawa, Kanagawa, JP;

Youichi Hayata, Kanagawa, JP;

Akihiro Hashimoto, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/104 ;
U.S. Cl.
CPC ...
G01B 1/104 ;
Abstract

The width measuring apparatus according to this invention includes a light emitting element, a pair of light receiving elements, a measurement support table for fixing them and calculating device, where a pair of partial laser beams of the laser beam from the light emitting element which are not projected over a traveling elongated object to be measured are received by the light receiving elements, and a width of the elongated object calculated from the received light quantities of the pair of partial laser beams. The width measuring apparatus according to this invention further includes a single light emitting element, pairs of light receiving elements, a measurement support table for fixing and calculating devise, where pairs of partial laser beams of the laser beams from the light emitting element which are not projected over traveling elongated objects are received by the light receiving elements, and widths of the elongated objects are calculated from light quantities of the received partial laser beams. Based on the apparatus, it can continuously and optically measure the width of the object in a non-contact fashion with a less amount of measuring error, and measure the widths of the objects at a less expensive cost, securing a working space.


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