The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2002
Filed:
Sep. 04, 2001
Gang Paul Chen, Monterey Park, CA (US);
Avishay Eyal, Pasedena, CA (US);
Anthony S. Kewitsch, Santa Monica, CA (US);
Victor Leyva, Pasedena, CA (US);
George A. Rakuljic, Santa Monica, CA (US);
Other;
Abstract
Optical components, particularly microoptic glass components used in synthesizing birefringence in filter systems based on polarization interferometer techniques, are fabricated using systems and methods which provide accurate frequency periodicity measurements. These measurements are derived from differential delays induced by in-process glass elements between beam components in a polarization interferometer unit and from progressive wavelength scanning across a wavelength band of interest. The consequent sinusoidal output variation has peak to peak spacings which are measured to provide frequency periodicity values from which precise length corrections for the optical elements can be calculated.