The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2002
Filed:
Apr. 19, 2000
Thomas Joseph Martel, Dewitt, NY (US);
K-G Devices Corporation, Dewitt, NY (US);
Abstract
A system and method for using electronically acquired imagery from a one-dimensional camera, to inspect an object for tolerance, color, blemishes, cracks or a wide variety of manufacturing defects that might be present in an object. The method used to detect manufacturing defects includes an algorithm for analyzing the pattern of annular elements in an array and detecting deviations from numerical acceptance norms, such as diameter, spacing, and symmetry, for the annular elements. In the inventive system, a one-dimensional video camera captures a single one-dimensional “slice” of target shape of an object with every line it scans. Each slice is broken down into “segments” consisting of sets of adjacent pixels that are similar in brightness, hue, or both. The one-dimensional camera delivers the segments to the system where they are sequenced. The system identifies every segment to determine what feature of the target shape the segment represents. Thereafter, predefined rules are used to determine if each identified segment deviates from numerical acceptance norms. The inventive method is thus used to analyze periodic arrays of any arbitrary target shape, thereby working in a range of different object acceptance norms and being easily adaptable to change from one set of norms to another.