The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2002
Filed:
Jul. 12, 2000
Norbert Poellmann, Eching, DE;
LRE Technology Partner GmbH, Munich, DE;
Abstract
In a method for recognizing the faulty positioning of an optically evaluatable test strip in a device for measuring a substance in a liquid, especially for blood sugar determination, the fluid to be investigated is applied to a test field ( ) of a test strip ( ) and the change in the reflection or transmission ability of the test field ( ) thereby effected is captured and evaluated. A measuring field ( ) of the measuring device associated with the test field of the test strip is divided into at least two measuring areas which, with respect to the insertion direction of the test strip, are arranged behind one another and are separately sensed. The test strip ( ) has at least in the area lying in front of the test field ( ), with respect to the insertion direction zones ( ) arranged behind one another and of different reflection or transmission abilities. The difference between the measured values of the two measured areas is formed and compared with a pre-given threshold value, and upon an exceeding of the threshold value a signal indicating faulty test strip positioning is created.