The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2002
Filed:
Nov. 20, 2000
Abstract
A testing method is provided for determining the hardness of a micro region, using indentation curves indicating relations between observed penetration depths and indenting forces when an arbitrary shaped indenter is pushed into standard samples of plural types. The method involves (1) measuring relations between observed penetration depths and indenting forces when the arbitrary shaped indenter is pushed into standard samples of plural types, to prepare the indentation curves, (2) determining a reference function indicative of macro hardness, by standardizing the relations between the indenting forces and macro hardness at the same penetration depth as an index, for the indentation curves of the standard samples of plural types, (3) measuring a relation between the penetration depth and indenting force of an arbitrary sample, and (4) determining the hardness of a micro region from the measured value in step (3) according to the reference function as determined in step (2).