The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2002

Filed:

Jul. 07, 2000
Applicant:
Inventors:

Mark S. Gebert, Pacifica, CA (US);

Ramanan Pitchumani, Delft, NL;

Willem J. Beekman, Delft, NL;

Gabriel M. H. Meesters, Delft, NL;

Brian Scarlett, Den Haag, NL;

Assignee:

Genencor International, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/56 ;
U.S. Cl.
CPC ...
G01N 3/56 ;
Abstract

The present invention provides methods and devices for measuring granule impact strength and granule attrition rates by vibrating a small container of granules at a well-controlled amplitude in order to inflict reproducible damage to the granules. Damage to the granules is measured as a function of time and amplitude and attrition rates are measured in terms of dust generate per number of collisions versus mass of the granules. The measurements obtained yield a highly reproducible means for characterizing granule attrition, attrition rates, and fragmentation.


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