The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Jul. 16, 1999
Per Anders Holmberg, Stockholm, SE;
Dan Olov Halvarsson, Stockholm, SE;
Tomas Jonsson, Södertälje, SE;
Telefonaktiebolaget LM Ericsson, Stockholm, SE;
Abstract
For fault testing in a digital system, a processor unit is made available from other activities and the logical units to be tested are set to a predetermined state. An output response analyze is activated and the processor unit generates a set of stimuli, influencing the appropriate logical units. The output response analyzer collects responses to the stimuli at different nodes in the digital system and creates signatures from them. The signals are verified and if a fault is noticed, this error is noticed. The present state of the processor and other logical units are stored in a storage device prior to the test and recovered after the testing is finished. This fault testing can be performed both at chip and board levels, and on systems with several units.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile