The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2002

Filed:

Dec. 18, 1998
Applicant:
Inventors:

Larry L. Byers, Apple Valley, MN (US);

Jerome G. Carlin, St. Paul, MN (US);

Michael R. Overley, Maple Grove, MN (US);

Gary R. Robeck, Albertville, MN (US);

Lloyd E. Thorsbakken, Blaine, MN (US);

Assignee:

Unisys Corporation, Blue Bell, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 ; H04L 1/22 ; H04B 1/74 ;
U.S. Cl.
CPC ...
G06F 3/00 ; H04L 1/22 ; H04B 1/74 ;
Abstract

An improved fault detection system and method for detecting the occurrence of faults within the addressing logic of a storage device is provided. Data stored to a selected address within a storage device includes a copy of the selected address. During a subsequent read operation, the copy of the address is read from memory and compared to the read address used to perform the memory access. If the addresses are not the same, a potential addressing fault occurred within the control logic of the storage device. The fault detection system is particularly adaptable for use with storage devices having a relatively small number of addressable locations, each containing a relatively large number of bits. According to one embodiment of the invention, the storage device is a General Register Array (GRA) utilized as a queue.


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