The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2002

Filed:

Jan. 26, 1999
Applicant:
Inventors:

Miwako Doi, Kawasaki, JP;

Akira Morishita, Tokyo, JP;

Naoko Umeki, Kawasaki, JP;

Shunichi Numazaki, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

The present invention provides an object detection apparatus which includes an image capture section for capturing a distance image indicating distance information to a subject and representing intensity distribution of light reflected by the subject and a detection section for detecting one of a target object and/or a motion of the target object from the distance image captured by the image capture section. The present invention also provides a motion control apparatus for controlling a motion of an object such as a toy. The motion control apparatus includes an image capture section for capturing a distance image indicating distance information to a subject and representing intensity distribution of light reflected by the subject, a detection section for detecting one of a target object and/or a motion of the target object from the distance image captured by the image capture section, and a control section for controlling a motion of an object based on a result of detection of the detection section. The present invention also provides a pattern recognition apparatus which is capable of robustly recognizing a pattern at high speed and which can easily be miniaturized.


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