The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Feb. 06, 2001
Keely Anne Wagner, Neenah, WI (US);
Brian John Melewski, Appleton, WI (US);
Timothy Patrick Murphy, Menasha, WI (US);
Daniel Thomas Sullivan, New London, WI (US);
Todd Robert Thyes, Appleton, WI (US);
Gregory W. Burneske, Sherwood, WI (US);
Memorylink Corporation, Neenah, WI (US);
Abstract
The quality of a channel for each of a plurality of receive antennas is determined in part by examining data collected during reception of test data. Substantially simultaneously, payload data is also used to evaluate channel quality for at least one antenna. A quality metric calculated for any given antenna is the result of measurements made upon the test and payload data. Parameters used to calculate the quality metric are preferably divided into two sets of non-identical parameters, those based on the test data and those based on the payload data. These parameters preferably include jitter, received signal strength, CRC errors and synchronization errors. By continuously updating quality metrics based on both test and payload data, more reliable assessments can be made of the various antennas being used. As a result, antenna selection is rendered commensurately more reliable thereby improving received signal quality.