The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2002

Filed:

Apr. 28, 1999
Applicant:
Inventors:

Haim Rochberger, Netanya, IL;

Meir Morgenstern, Or Yehuda, IL;

David Margolis, Haifa, IL;

Assignee:

3Com Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/228 ;
U.S. Cl.
CPC ...
H04L 1/228 ;
Abstract

A method of calculating a complex node representation for logical nodes in a hierarchical peer group in a PNNI based ATM network. The summary information for default spokes, exceptions and bypasses is determined in a way that closely represents the underlying metrics associated with the peer group. A list of all border nodes in the peer group is generated and maintained and a matrix of tables is generated, one table for each metric per each class of service. The table is populated by the best value associated with the corresponding metric for a particular pair of border nodes within a particular class of service. Once the table is populated, each element is placed in a group or bin. The bins are generated by dividing the full range of the metric into a plurality of smaller subgroups or bins. The bin having a count greater than a threshold count is selected and 80% of the worst value for that group is used as the default spoke. If no bin exists having at least a threshold count, the number of bins is reduced by one and a new set of subranges is calculated. The elements of the table are placed in the newly divided bins and a scan is performed once again.


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