The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Oct. 24, 2000
Applicant:
Inventors:
Isamu Kuribayashi, Tokyo, JP;
Naoki Hayashida, Tokyo, JP;
Assignee:
TDK Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 ;
U.S. Cl.
CPC ...
G11B 7/00 ;
Abstract
A method for recording a phase change optical recording medium under optimal conditions is provided. In the recording of a phase change optical recording medium which has a phase change recording layer and which has a data recording area and a test write area, the test write area is recorded before the recording of the data recording area, and the recording of the test write area is conducted corresponding to the recording history of the data recording area in order to determine optimal writing and erasing conditions for the data recording area on the basis of the quality of the read-out signal of the test write area.