The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Jun. 20, 2001
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope is disclosed that includes: a light source that emits light in a wavelength range that includes both visible and infrared wavelengths, an illuminating optical system for illuminating a specimen with the light from the light source, an objective lens for gathering light from the specimen and causing it to converge, a light beam dividing unit that divides the beam of light from the objective lens into plural divided light paths such that the wavelength ranges in the divided light paths differ from one another, a magnification conversion optical system in one of the divided light paths which converts the magnification of images formed by light in that divided light path, and an imaging device located in each of at least two of the divided light paths, wherein the objective lens has a magnifying power less than or equal to 32 and a numerical aperture greater than or equal to 0.80. The microscope allows the viewer to change the magnification as well as the wavelength range used to view an image of a specimen while minimizing the introduction of mechanical shock as the magnification and wavelength range used to view the specimen are changed.