The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Nov. 03, 2000
Dennis D. Earl, Knoxville, TN (US);
Stephen W. Allison, Knoxville, TN (US);
Michael R. Cates, Oak Ridge, TN (US);
Alvin J. Sanders, Knoxville, TN (US);
Other;
Abstract
This invention relates to a method and apparatus for making absolute distance or ranging measurements using Fresnel diffraction. The invention employs a source of electromagnetic radiation having a known wavelength or wavelength distribution, which sends a beam of electromagnetic radiation through a screen at least partially opaque at the wavelength. The screen has an aperture sized so as to produce a Fresnel diffraction pattern. A portion of the beam travels through the aperture to a detector spaced some distance from the screen. The detector detects the central intensity of the beam as well as a set of intensities displaced from a center of the aperture. The distance from the source to the target can then be calculated based upon the known wavelength, aperture radius, and beam intensity.