The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Mar. 29, 2001
Applicant:
Inventor:
Andrew L. Ingles, Jr., Alpharetta, GA (US);
Assignee:
Fitel USA Corp., Norcross, GA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract
This disclosure provides a method, system, and computer system for measuring bending loss of an optical fiber with an optical time domain reflectometer (OTDR). Generally, the method of the present invention provides OTDR device that measures a one-way OTDR splice loss at a point in the optical fiber. Subsequently, a bend is introduced into the optical fiber and a second one-way OTDR splice loss measurement is performed at the same point in the optical fiber as the first measurement. Thereafter, the bending loss of the optical fiber is determined and related to an approximate cut-off wavelength of the optical fiber.