The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Jul. 11, 2000
Applicant:
Inventors:
Christopher Henry Orr, Cumbria, GB;
Craig Janson Luff, Cumbria, GB;
Thomas Dockray, Cumbria, GB;
Duncan Whittemore Macarthur, Los Alamos, NM (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/18 ;
U.S. Cl.
CPC ...
G01T 1/18 ;
Abstract
A method and apparatus for monitoring alpha contamination are provided in which ions generated in the air surrounding the item, by the passage of alpha particles, are moved to a distant detector location. The parts of the item from which ions are withdrawn can be controlled by restricting the air flow over different portions of the apparatus. In this way, detection of internal and external surfaces separately, for instance, can be provided. The apparatus and method are particularly suited for use in undertaking alpha contamination measurements during the commissioning operations.