The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2002

Filed:

Aug. 12, 1999
Applicant:
Inventors:

Edward Barkan, Miller Place, NY (US);

Chinh Tan, Centerreach, NY (US);

Vikram Bhargava, Coram, NY (US);

Miklos Stern, Flushing, NY (US);

Assignee:

Symbol Technologies, Inc., Hotsville, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 ;
U.S. Cl.
CPC ...
G06K 7/10 ;
Abstract

Light is focused in a system for electro-optically scanning and reading bar code symbols by an aperture stop having a first optical portion for optically modifying a first part of a light beam to have a beam cross-section of a known size within a depth of field in which a symbol to be read is scanned by the first beam part, and a second light-transmissive, optical portion bounding the first portion and operative for optically modifying and directing a second part of the light beam away from the first part.


Find Patent Forward Citations

Barkan, Edward. (2002). Laser focusing aperture and method (U.S. Patent No. 6454167). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6454167

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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