The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Oct. 09, 2001
National Instruments Corporation, Austin, TX (US);
Abstract
A signal analysis system and method for analyzing an input signal acquired from a mechanical system. The mechanical system may include at least one rotating apparatus. The signal analysis system may include an input for receiving samples of an input signal acquired from the mechanical system, wherein the input signal is sampled in time, and wherein the input signal comprises a plurality of order components. The signal analysis system may also include a processor coupled to the input and a memory medium coupled to the processor which stores analysis software. The processor may be operable to execute the analysis software to: (a) perform an invertible joint time-frequency transform on the input signal to produce a first array of coefficients which depend on time and frequency; (b) generate a modified array of coefficients from the first array of coefficients, wherein the modified array of coefficients corresponds to a desired subset of the plurality of order components; and (c) generate a time domain signal from the modified array of coefficients. The signal analysis system may also include a presentation device coupled to the processor which is operable to present the time domain signal to a user. The time domain signal is useable in analyzing operation of the rotating apparatus in the mechanical system.