The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2002

Filed:

Dec. 28, 1999
Applicant:
Inventors:

Mohamed Dekhil, Sunnyvale, CA (US);

Evan R. Kirshenbaum, Mountain View, CA (US);

Jerremy Holland, Los Altos Hills, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/718 ;
U.S. Cl.
CPC ...
G06F 1/718 ;
Abstract

A system for monitoring system behavior of a managed/instrumented system is described. The system includes a measurement module coupled to the managed system to generate measurement data of the managed system. The measurement data include past measurement data and current measurement data. A store is also provided that stores the past measurement data. A genetic programming module is coupled to the store to evolve the evolved predictor based on the past measurement data and predetermined effectiveness criteria such that the evolved predictor predicts the system behavior of the managed system when supplied with the current measurement data. The genetic programming module genetically manipulates a set of candidate predictors to produce the evolved predictor. A system for generating the evolved predictor is also described.


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