The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Apr. 02, 1999
Applicant:
Inventors:
Raymond Lee Gordon, San Diego, CA (US);
Atle Lohrmann, Oslo, NO;
Assignee:
Nortekusa, LLC., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/700 ;
U.S. Cl.
CPC ...
G06F 1/700 ;
Abstract
A system, method and computer-program product for automatically calibrating a current measuring device. The system and method includes a means for automatically determining viable data segments that can be used for calibration purposes. A quality factor that is associated with each calibration realization is provided. The quality factor is an assessment of the quality of the data in a viable data segment as determined based on user input, statistical information, and the validity of the assumptions used to calculate the calibration coefficient.