The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2002

Filed:

Aug. 18, 1999
Applicant:
Inventor:

Tsugio Ito, Hamamatsu, JP;

Assignee:

Yamaha Corporation, Hamamatsu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/316 ;
U.S. Cl.
CPC ...
G01R 2/316 ;
Abstract

An impulse response measuring method uses an echo chamber in which a speaker and a microphone are arranged. The speaker produces measured sounds, used for measurement of impulse response, which are detected by the microphone. The microphone produces sound signals corresponding to the measured sounds. An analysis device calculates impulse response of the echo chamber based on the sound signals. Then, the impulse response is subjected to Fourier transform to produce complex data consisting of real parts and imaginary parts with respect to an axis of frequency. The real parts and imaginary parts of the complex data are respectively subjected to smoothing processes to produce average data, which are combined together to form smoothed complex data. The smoothed complex data are subjected to inverse Fourier transform to produce anechoic-chamber-equivalent impulse response, which is a simulated impulse response of an anechoic chamber substantially corresponding to the impulse response actually measured in the echo chamber.


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