The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2002

Filed:

Feb. 10, 2000
Applicant:
Inventor:

Peter J. Oefner, Redwood City, CA (US);

Assignee:

Stanford University, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/3483 ; G01N 3/004 ; G01N 3/030 ; C07H 2/100 ;
U.S. Cl.
CPC ...
G01N 3/3483 ; G01N 3/004 ; G01N 3/030 ; C07H 2/100 ;
Abstract

The present invention provides a method for detecting polymorphisms in a nucleic acid by preconditioning a sample of nucleic acids to completely denature the nucleic acids, e.g., via heating and/or chemical treatment, and performing high-performance liquid chromatography (HPLC) on the nucleic acid under denaturing conditions to identify any polymorphisms. The nucleic acids to be analyzed are completely denatured prior to application of the sample to a stationary reverse-phase support and throughout the HPLC process. Sample elution is also carried out under completely denaturing conditions, and the sample mixture is eluted with a mobile phase containing an ion-pairing reagent and an organic solvent.


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