The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2002

Filed:

Jun. 18, 2001
Applicant:
Inventors:

Tsunehiko Watanabe, Kanagawa, JP;

Yasuyuki Nozaki, Kanagawa, JP;

Ryo Nakashige, Kanagawa, JP;

Takuro Tamura, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C07H 2/102 ; G01N 3/348 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C07H 2/102 ; G01N 3/348 ;
Abstract

A method for displaying results of hybridization experiments using a biochip is provided. In the method, a plurality of control spots spotted in each of a plurality of sections defined on a biochip is measured. The measured data are plotted on a graph for each section, and all of the graphs are simultaneously displayed on a single screen in the same arrangement as that of the sections on the biochip. By simultaneously displaying all of the graphs on a single screen, it is possible to skim the whole biochip to find experimental errors. Also, experimental errors can be quantified with respect to the dispersion of control data on the basis of the linearity of the data points and slope angles defined for each data points on a graph.


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