The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Aug. 10, 1998
Jerry L. Prince, Lutherville, MD (US);
Nael F. Osman, Baltimore, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
A method of measuring motion of an object by magnetic resonance imaging including applying a pulse sequence to spatially modulate a region of interest of said object. At least one spectral peak is acquired from the Fourier domain of the spatially modulated object. The inverse Fourier transform information of the acquired spectral peaks is computed. The angle images are computed from the spectral peak. The angle images employed to measure motion of the object. The method may employ a SPAMM pulse sequence as the pulse sequence. The angle images may be employed to compute directly and automatically, planar strain in two dimensions or a full strain tensor in three dimension. The data may be useful in detection and quantification of myocardial ischemia and infarction. The angle images may also be employed to generate data equivalent to planar tag data automatically and can be employed to generate any desired tag separations. The angle images may also be employed to compute displacement, synthesize tag patterns and compute optical flow without requiring the use of regularization.