The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Dec. 23, 1998
Haim Jacobson, Tenafly, NJ (US);
David Foni, Englewood, NJ (US);
Marian Kramarczyk, Suffern, NY (US);
ADC Telecommunications, Inc., Eden Prairie, MN (US);
Abstract
A system and method for accessing a number of communication lines by one or more testing devices is disclosed. Each of the communications lines is coupled through the system and includes a first termination at a first telecommunications termination site and a second termination at a second telecommunications termination site. The system includes a number of line access devices, each of which is coupled to at least one of the communication lines terminating at the first telecommunications termination site and at least one of the communication lines terminating at the second telecommunications termination site. The system further includes a test device interface, signal direction circuitry, a communications device that facilitates remote access to the test access system by a remote processing unit, and a control device. The control device controls the signal direction circuitry to couple a selected communication line to a selected testing device coupled to the test device interface in response to a control signal received from the remote processing unit. The control device may also control the signal direction circuitry to couple a first selected line access device with a second selected line access device so as to establish a cross connection between the first and second selected line access devices. The test access system provides testing, monitoring, and cross connecting of high speed digital transmission lines, such as digital transmission lines characterized by transmission rates on the order of tens or hundreds of megabytes per second