The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Nov. 25, 1998
William Allen Berezowitz, Greenfield, WI (US);
John Robert Breunissen, Wauwatosa, WI (US);
Diane Marie Miesbauer, Brookfield, WI (US);
GE Medical Technology Services, Inc., Pewaukee, WI (US);
Abstract
Possible failure of x-ray tubes is predicted by monitoring and analysis of operating parameters considered leading indicators of failure. Historical data for a tube population is analyzed by discriminant analysis to develop a failure prediction algorithm. The algorithm is used to correlate operating parameters, or values derived from the operating parameters with a potential for tube failure. The operating parameters may include anode overcurrent events and spits, or spit rate exceeded errors for a diagnostic system in which the x-ray tube is installed.