The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2002

Filed:

Jul. 13, 1998
Applicant:
Inventors:

Kenji Hamaguri, Osaka, JP;

Teruo Ichikawa, Gamagori, JP;

Kazunari Mizuguchi, Toyokawa, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/700 ;
U.S. Cl.
CPC ...
H04N 1/700 ;
Abstract

A calibrating system of a display characteristic measurement apparatus includes a calibration pattern display unit for displaying a calibration pattern at substantially the same luminescence characteristic as that of a display apparatus to be measured, an image pickup unit provided in a display characteristic measurement apparatus for picking up a calibration pattern displayed on the display apparatus to generate image data, and a calculator for calculating, based on the generated image data, calibration data for the display characteristic measurement apparatus.


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