The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2002

Filed:

Jun. 08, 2000
Applicant:
Inventor:

John W. Pursel, Sunnyvale, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

An arrangement and method for pressing down a semiconductor package arrangement with a controlled down-force balances a pressure bar on a fulcrum. The pressure bar is biased by a spring in a first direction downwardly towards a semiconductor package to be held. An adjustment device limits the amount of rotation of the pressure bar around the fulcrum. An adjustment device controls moves the limit of rotation of the pressure bar around the fulcrum so that the pressure applied by the spring and pressure bar against the semiconductor package may be precisely controlled. This controlling of the pressure applied against the semiconductor package allows for a consistency of testing during the electrical characterization testing of the semiconductor package and eliminates the manual holding down of the package during testing.


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