The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Sep. 30, 1998
Hao-Peng Xu Duffy, Centerport, NY (US);
North Shore-Long Island Jewish Research Institute, Manhasset, NY (US);
Abstract
The present invention provides Methyl- (or Mutant-) Differential Display (MDD) methods and nucleic acid probes for detecting mutations and the methylation patterns of nucleic acids. The methods of the present invention are particularly useful for detecting and isolating genomic DNA fragments which are near coding and regulatory regions of genes and which are differentially mutated or methylated relative to the corresponding DNA from normal cells. Genes are frequently not methylated in the cells where they are expressed but are methylated in cell types where they are not expressed. Moreover, tumor cell DNA is frequently methylated to a different extent and in different regions than is the DNA of normal cells. The present invention is used for identifying which regions of the genome are methylated or mutated in different cell types, including cancerous cell types. The present invention is also used for diagnosing whether a tissue sample is cancerous, and whether that cancerous condition is non-metastatic or metastatic.