The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Nov. 08, 2000
Sangho Kim, Philadelphia, PA (US);
Sehyun Shin, Bryn Mawr, PA (US);
Young I. Cho, Cherry Hill, NJ (US);
Rheologics, Inc., Exton, PA (US);
Abstract
A method for isolating the effects of surface tension and/or yield stress of a fluid that is flowing in a U-shaped tube wherein one or both legs of the U-shaped tube is monitored over time for the changing height of the respective fluid columns therein. A portion of the U-shaped tube comprises a flow restrictor, e.g., a capillary tube, of known dimensions. Monitoring one or both of the moving fluid columns over time permits the determination of the viscosity of the fluid flowing therein over a range of shear rates from the difference in fluid column heights. However, it is necessary to isolate the effects of surface tension and/or yield stress to obtain an accurate viscosity determination. The method provides one manner in which the surface tension effect can be subtracted from the difference in fluid column heights and then any yield stress effect can then be determined. Alternatively, the method also provides a process by which both the surface tension effect and yield stress effect can be determined simultaneously.