The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Mar. 24, 2000
Eileen H. You, San Jose, CA (US);
Weize Xie, Cupertino, CA (US);
John F. MacDonald, Lake Oswego, OR (US);
Sun Microsystems, Inc., Palo Alto, CA (US);
Abstract
A technique measuring accuracy of parasitic capacitance extraction defines the error in an extracted total net parasitic capacitance intended for timing analysis as a sum of the errors in the extracted values of the individual capacitance elements, with the error for each element being influenced by a weight factor. Similarly, the technique defines an error in the extracted value of a crosstalk factor for the net of interest as a difference between the errors in the extracted values of the individual capacitance elements, with the error in each element being influenced by a weight factor. For signal timing and crosstalk analyses, the weight factors allow a designer to focus calibration of the extraction tool on the capacitive element having the highest weight factor.