The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Dec. 03, 1998
Fahd Hinedi, Austin, TX (US);
James Nolan Hardage, Jr., Kyle, TX (US);
Lakshmikant Mamileti, Denver, CO (US);
Other;
Abstract
A bus-clock-speed-independent apparatus and method of wrap input/output (I/O) testing of an I/O interface is provided. Launch data is launched in response to a launch clock. A capture clock is derived from the launch clock by delaying the launch clock through a programmable delay. Launch data is wrapped through the I/O interface buffers and captured in response to the capture clock. A initial value of the programmable delay is selected and successively increased or decreased until the launch data is just captured, or just fails to be captured, respectively. The value of the programmable delay when this occurs provides a measure of the limiting speed of the I/O interface.