The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Nov. 08, 1999
Michel J. Bertrand, Verdun, CA;
Dimo Zidarov, Brossard, CA;
Other;
Abstract
A method of processing data representing intensity values of a measurement signal as a function of a discrete variable such as time, which signal being characterized by series of peaks mixed with a substantially regular background noise, provides efficient noise attenuation and peak detection capabilities. When applied to a two-dimensional system, the method comprises an initial step of forming an intensity histogram vector representing a frequency distribution from the intensity values, which intensity histogram vector having N frequency vector components associated with corresponding N intensity sub-ranges within a maximum range extending from a minimum intensity value to a maximum intensity value. This initial step is followed by a step of zeroing a portion of the data corresponding to the intensity values which are below an intensity threshold value derived from shape characteristics of the distribution. Then, the intensity threshold value is subtracted from each remaining portion of the data to obtain processed data representing the measurement signal in which each peak exhibits an enhanced signal-to-noise ratio. The method is also applicable to multi-dimensional measurement systems involving more than one variable, such as chromatography/mass spectrometry measurement techniques.