The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Mar. 29, 2000
Brian Mitchell Bass, Apex, NC (US);
Jean Louis Calvignac, Cary, NC (US);
Anthony Matteo Gallo, Apex, NC (US);
Marco C. Heddes, Raleigh, NC (US);
Michael Steven Siegel, Raleigh, NC (US);
Fabrice Jean Verplanken, La Gaude, FR;
Chad Everett Winemiller, Cary, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for systematically accessing and monitoring operating parameter signals within an IC device. A probe configuration logic selects a subset of signals from among a set of available signals within a physical or logical subdivision of the IC device. Signal access logic selectively provides physical or logical access from the selected subset of signals within the physical or logical subdivision of the IC device to a probe sensor, such that IC device operations may be flexibly and comprehensively monitored. A local mode selector provides remote access to the selected subset of signals at an input/output (I/O) data interface. Data packaging logic in communication with the probe sensor permits port mirroring of the I/O data interface.