The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2002

Filed:

Mar. 12, 1999
Applicant:
Inventor:

Shuji Nakao, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

Based on data for a designed, patterned figure, data for first through third contour figures as well as data for under-sized and over-sized figures are derived. Comparisons between the under-sized figure and the third contour figure and between the over-sized figure and the second contour figure are performed to check adequateness of resolution of the patterned figure. When the resolution is determined inadequate, information on a portion having such inadequate resolution is output. According to this method of verifying resolution of a patterned figure, a portion in a photo resist with inadequate resolution can easily be detected, thus permitting efficient device development.


Find Patent Forward Citations

Nakao, Shuji. (2002). Patterned figure resolution verification method and semiconductor pattern forming method (U.S. Patent No. 6449386). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6449386

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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